We also have the capability to coat our catalysts on your substrates. For
more information, please
e-mail us.
Material Characterization Equipment Includes:
- Surface area – multipoint BET method
- Specific metal area and metal dispersion – Chemisorption
- Pore volume and pore size distribution – N2
adsorption
- Surface and particle morphology and chemistry – Scanning
Electron Microscope (SEM)/Energy Dispersive Spectrometer (EDS)
- Reducibility and oxidizability –
Temperature-programmed-reduction (TPR) and
Temperature-programmed-oxidation (TPO)
- Solution chemistry -UV-Visible Spectrophotometer
- Material viscosity and shear rate profile - Brookfield Rheometer
- Rapid gas analysis- Micro-GCs or Mass Spectrometer
- Gas and Liquid (such as fuels) analysis- Agilent 6890 Research
GCs
Microscopy Services:
PCI Microscopy Services can provide the entire spectrum of services
from sample preparation through examination and analysis.
Microscope Capabilities
- PCI’s ISI DS130 Scanning Electron Microscope and EDS detector
provide both imaging and surface chemistry for elements of atomic
number 6 (carbon) and higher.
- The DS 130 is a two stage SEM with an accelerating voltage
adjustable from 0.5 to 40 kV using a LaB6 filament. The upper stage
is used for high magnification work with a realistic resolution of
20 nm. The sample size for this upper stage is limited to about 8 mm
in diameter by about 2 mm thick.
- The lower stage of the DS 130 can accommodate samples of up to
about 150 mm in diameter by 40 mm thick. It is typically used for
magnifications from about x 40 to x 25,000. This stage is equipped
with both a secondary electron (E-T) and backscattered electron
(Robinson) electron detector.
- EDS chemical analysis is performed in the lower stage using a
Kevex Quantum detector. This detector has an ultra thin window and
is sensitive to carbon and elements of higher atomic number.
The output of the digital data acquisition system includes:
- Images (hard Copy or electronic files)
- Surface Chemistry (with or without standards)
- Compositional Maps
Sample Preparation:
PCI maintains cutting, mounting and polishing equipment in order to do
cross sectional analysis. Gold and carbon coating can be done in order
to image insulating samples.
Analysis and Information Requests
If you would like to discuss a particular application further, please
download, complete and fax us an Applications
Form so that we can better serve your requirements.